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Research at OU

Engineering

Plasma Devices to Guide and Collimate a High Density of MeV Electrons_KODAMA Ryosuke
(Graduate School of Engineering)

 



 

Chemical Identification of Individual Surface Atoms by Atomic Force Microscopy
SUGIMOTO Yoshiaki and ABE Masayuki (Graduate School of Engineering)

Atomic force microscopy



Measurement of chemical bonding forces toward chemical identification



Figure 1

Finding the “atom's fingerprint”


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Chemical identification of individual surface atoms
Outlook
Acknowledgements

Research

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