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Seminars & Symposiums

Seminar on powder and film X-ray diffractometry

2014-10-2 (Thu) 1:00 p.m. - 5:00 p.m.

A seminar on powder and film X-ray diffractometry will be held on Thursday, October 2.  Powder diffractometry performs measurement on a wide range of objects such as powders, polycrystals, and polycrystalline thin films. In this seminar, the principles of X-ray diffractometry of powder samples and polycrystalline thin films as well as crystallite size analysis will be explained. In the case of X-ray diffractometry for thin film, explanation about film characterization basics, especially, out of plane diffraction and in-plane X-ray diffraction, rocking curve, reciprocal space map, and reflectivity will be provided.
Date & Time: Thursday, October 2, 2014 -- 1:00~5:00 p.m.
Venue: Library Hall, Science and Engineering Library, Suita campus, Osaka University
Space is limited to 100.
Intended for: beginner-level faculty and staff, graduate students, and undergraduate students in the 4th year
Lecturer: MORITANI Yoji, Osaka Office, Application Technology Center, X-Ray Device Business Division, Rigaku Corporation


Program


1:00~2:40 p.m.

  • Measurement of powder and polycrystalline thin film and analysis of crystallite size 
  • Thin film measurement -- out-of-plane X-ray diffraction, in-plane X-ray diffraction, and reflectivity

3:00~4:00 p.m.

  • Measurement of reciprocal space map and rocking curve of epitaxial film

4:10~5:00 p.m.

  • Measurement and analysis of small angle X-ray scattering of nano particles
Date: 2014-10-2 (Thu) 1:00 p.m. - 5:00 p.m.
Organizer: Center for Scientific Instrument Renovation and Manufacturing Support
Venue: Library Hall, Science and Engineering Library, Suita campus
Registration: Registration online is necessary.
URL: http://www.reno.osaka-u.ac.jp/reuse-seminar
Contact: Center for Scientific Instrument Renovation and Manufacturing Support, Suita campus, Osaka University
event@reno.osaka-u.ac.jp

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